The Risk Focus Team at the Carnegie Mellon Software Engineering Institute (SEI) has identified a means of characterizing risk-based diagnostic methods and techniques. The Risk Focus Team has constructed a tentative "roadmap" for consultants, program managers, and other personnel involved in the systems and software acquisition community. The roadmap will help them to identify the appropriate risk diagnostic techniques for assessing threats to program success.
This technical note describes the characteristics that determine whether a risk diagnostic method qualifies for the roadmap. The technical note identifies three methods, the SEI Software Risk Evaluation, Architectural Tradeoff Analysis Method, and the SEI Commercial off-the-shelf (COTS) Usage Risk Evaluation that fit the characteristics described. The technical note also describes the characteristics of diagnostic methods that do not qualify for the roadmap.
This report is related to the following area(s) of work:
Acquisition SupportTechnical Note
CMU/SEI-2004-TN-013
September 2004
SEI:
Williams, Ray; Sereno, Kathryn; Bentrem, Laura; & Merendino, Thomas. Risk Based Diagnostics (CMU/SEI-2004-TN-013). Software Engineering Institute, Carnegie Mellon University, 2004. http://www.sei.cmu.edu/library/abstracts/reports/04tn013.cfm
IEEE:
R. Williams, K. Sereno, L. Bentrem, and T. Merendino, "Risk Based Diagnostics," Software Engineering Institute, Carnegie Mellon University, Pittsburgh, Pennsylvania, Technical Note CMU/SEI-2004-TN-013, 2004. http://www.sei.cmu.edu/library/abstracts/reports/04tn013.cfm
APA:
Williams, R., Sereno, K., Bentrem, L., & Merendino, T. (2004). Risk Based Diagnostics (CMU/SEI-2004-TN-013). Retrieved May 25, 2013, from the Software Engineering Institute, Carnegie Mellon University website: http://www.sei.cmu.edu/library/abstracts/reports/04tn013.cfm
CHI:
Williams, Ray, Kathryn Sereno, Laura Bentrem, and Thomas Merendino. Risk Based Diagnostics (CMU/SEI-2004-TN-013). Pittsburgh, PA: Software Engineering Institute, Carnegie Mellon University, 2004. http://www.sei.cmu.edu/library/abstracts/reports/04tn013.cfm
MLA:
Williams, R., Sereno, K., Bentrem, L., & Merendino, T. 2004. Risk Based Diagnostics (Technical Report CMU/SEI-2004-TN-013). Pittsburgh: Software Engineering Institute, Carnegie Mellon University. http://www.sei.cmu.edu/library/abstracts/reports/04tn013.cfm
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