Dependability Cases
Many large software systems display fragility or a lack of dependability caused by inattention to details at various stages of development (e.g., missing data, undocumented assumptions, lack of testing), resulting in a failure to catch errors. This technical note explains how to create a dependability case for a system that helps identify and keep track of such details. A dependability case is defined here as a structured argument providing evidence that a system meets its specified dependability requirements. The technical note describes how to structure the argument and present evidence to support it. A sample problem is presented, as well as issues raised by that problem and future goals.
This report is related to the following area(s) of work:
Performance and DependabilitySoftware Assurance
Technical Note
CMU/SEI-2004-TN-016
May 2004
Cite This Report
SEI:
Weinstock, Charles; Goodenough, John; & Hudak, John. Dependability Cases (CMU/SEI-2004-TN-016). Software Engineering Institute, Carnegie Mellon University, 2004. http://www.sei.cmu.edu/library/abstracts/reports/04tn016.cfm
IEEE:
C. Weinstock, J. Goodenough, and J. Hudak, "Dependability Cases," Software Engineering Institute, Carnegie Mellon University, Pittsburgh, Pennsylvania, Technical Note CMU/SEI-2004-TN-016, 2004. http://www.sei.cmu.edu/library/abstracts/reports/04tn016.cfm
APA:
Weinstock, C., Goodenough, J., & Hudak, J. (2004). Dependability Cases (CMU/SEI-2004-TN-016). Retrieved May 24, 2013, from the Software Engineering Institute, Carnegie Mellon University website: http://www.sei.cmu.edu/library/abstracts/reports/04tn016.cfm
CHI:
Weinstock, Charles, John Goodenough, and John Hudak. Dependability Cases (CMU/SEI-2004-TN-016). Pittsburgh, PA: Software Engineering Institute, Carnegie Mellon University, 2004. http://www.sei.cmu.edu/library/abstracts/reports/04tn016.cfm
MLA:
Weinstock, C., Goodenough, J., & Hudak, J. 2004. Dependability Cases (Technical Report CMU/SEI-2004-TN-016). Pittsburgh: Software Engineering Institute, Carnegie Mellon University. http://www.sei.cmu.edu/library/abstracts/reports/04tn016.cfm
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