Mutational input testing (fuzzing, and in particular dumb fuzzing) is an effective technique for discovering vulnerabilities in software. However, many of the bitwise changes in fuzzed input files are not relevant to the actual software crashes found.
This report describes an algorithm that efficiently reverts bits from the fuzzed file to those found in the original seed file, keeping only the minimal bits required to recreate the crash under investigation. This technique reduces the complexity of analyzing a crashing test case by eliminating the changes to the seed file that are not essential to the crash being evaluated.
This report is related to the following area(s) of work:
Security and SurvivabilityTechnical Note
CMU/SEI-2012-TN-018
October 2012
SEI:
Householder, Allen; Well There’s Your Problem: Isolating the Crash-Inducing Bits in a Fuzzed File (CMU/SEI-2012-TN-018). Software Engineering Institute, Carnegie Mellon University, 2012. http://www.sei.cmu.edu/library/abstracts/reports/12tn018.cfm
IEEE:
A. Householder, "Well There’s Your Problem: Isolating the Crash-Inducing Bits in a Fuzzed File," Software Engineering Institute, Carnegie Mellon University, Pittsburgh, Pennsylvania, Technical Note CMU/SEI-2012-TN-018, 2012. http://www.sei.cmu.edu/library/abstracts/reports/12tn018.cfm
APA:
Householder, A., (2012). Well There’s Your Problem: Isolating the Crash-Inducing Bits in a Fuzzed File (CMU/SEI-2012-TN-018). Retrieved May 22, 2013, from the Software Engineering Institute, Carnegie Mellon University website: http://www.sei.cmu.edu/library/abstracts/reports/12tn018.cfm
CHI:
Householder, Allen, Well There’s Your Problem: Isolating the Crash-Inducing Bits in a Fuzzed File (CMU/SEI-2012-TN-018). Pittsburgh, PA: Software Engineering Institute, Carnegie Mellon University, 2012. http://www.sei.cmu.edu/library/abstracts/reports/12tn018.cfm
MLA:
Householder, A., 2012. Well There’s Your Problem: Isolating the Crash-Inducing Bits in a Fuzzed File (Technical Report CMU/SEI-2012-TN-018). Pittsburgh: Software Engineering Institute, Carnegie Mellon University. http://www.sei.cmu.edu/library/abstracts/reports/12tn018.cfm
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