This educational materials package was developed for instructors of software verification techniques in graduate and undergraduate software engineering courses, and for those who teach industrial continuing education courses on the meaning and methods of software inspections.
Software inspections are a low-tech, highly effective verification technique. Research has consistently shown that the defect detection rate of inspections is higher than that of many traditional testing techniques. This package includes materials for demonstrating how to perform an inspection and also for "selling" students on the effectiveness of inspections. It complements EM-005, Scenes of Software Inspections, providing additional background material and exercises for using that set of educational materials.
Educational Materials
CMU/SEI-93-EM-007
February 1993
SEI:
Tomayko, James; & Murphy, James. Materials for Teaching Software Inspections (CMU/SEI-93-EM-007 ). Software Engineering Institute, Carnegie Mellon University, 1993. http://www.sei.cmu.edu/library/abstracts/reports/93em007.cfm
IEEE:
J. Tomayko, and J. Murphy, "Materials for Teaching Software Inspections," Software Engineering Institute, Carnegie Mellon University, Pittsburgh, Pennsylvania, Educational Materials CMU/SEI-93-EM-007 , 1993. http://www.sei.cmu.edu/library/abstracts/reports/93em007.cfm
APA:
Tomayko, J., & Murphy, J. (1993) . Materials for Teaching Software Inspections (CMU/SEI-93-EM-007 ). Retrieved May 24, 2012, from the Software Engineering Institute, Carnegie Mellon University website: http://www.sei.cmu.edu/library/abstracts/reports/93em007.cfm
CHI:
Tomayko, James, and James Murphy. Materials for Teaching Software Inspections (CMU/SEI-93-EM-007 ). Pittsburgh, PA: Software Engineering Insitute, Carnegie Mellon University, 1993. http://www.sei.cmu.edu/library/abstracts/reports/93em007.cfm
MLA:
Tomayko, J., & Murphy, J. 1993. Materials for Teaching Software Inspections (Technical Report CMU/SEI-93-EM-007 ). Pittsburgh: Software Engineering Insitute, Carnegie Mellon University. http://www.sei.cmu.edu/library/abstracts/reports/93em007.cfm
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