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10th International Software Product Line Conference
(SPLC 2006)
21-24 August 2006
Baltimore, Maryland, USA

Conference Panels


23 August 2006

P1 

Product Derivation Approaches
Panel moderator: David Weiss, Avaya Labs
Model problem: Interactive Television Applications

P2

Testing in a Software Product Line
Panel moderator: Klaus Pohl, Lero, The Irish Software Engineering Research Centre & University of Duisburg-Essen, Germany
Model problem: The eShop Product Line

  

24 August 2006

P3

Product Line Research
Panel moderator: Liam O'Brien, Lero, The Irish Software Engineering Research Centre

 


Panel 1 (P1)
Panel on Product Derivation Approaches
23 August 2006

Panel moderator: David Weiss, Avaya Labs

Panelists:
Danilo Beuche, pure-systems
Charles Krueger, BigLever Software
Rob van Ommering, Philips Research
Juha-Pekka Tolvanen, MetaCase

Abstract
This panel looks at product derivation approaches and their differences, strengths and weaknesses in different PLE situations. Each panelist will examine a common problem (the Interactive Television Applications) and provide an overview of their product derivation approach and how it was used to solve the problem.

Overview
At some point, no matter how wonderful your product line process is, you have to ship the products. The panelists will each present a different approach to PLE, concentrating on how actual products are derived from specifications. The approaches presented include feature modeling, architecture description languages, UML and domain-specific modeling languages.

A common product specification and derivation task will be given to all panelists, and they will show how their approach works on it. The audience can - and is warmly encouraged to - participate, ask additional questions, heckle, and hopefully laugh. A major goal is to identify the classes of PLE situations that best suit each approach.

Following are some of the questions and issues to be addressed by the panel.

  1. How large a portion of a product is automatically derived? Please answer in terms of some reasonably precise measure, such as percent of modules, classes, or KNCSL, or coverage in a feature model.
  2. How are new features and functionality developed? Give an example, if possible.
  3. What is the cost and time to create a new feature or change the application platform, e.g., in hours of effort as a fraction of effort needed to create the application engineering environment? Alternatively, how would you estimate the cost and time?

Panel 2 (P2)
Testing in a Software Product Line
23 August 2006

Panel moderator: Klaus Pohl, Lero, The Irish Software Engineering Research Centre & University of Duisburg-Essen, Germany

Panelists:
Georg Grütter, Robert Bosch GmbH, Germany
John D. McGregor, Clemson University, USA
Andreas Metzger, University of Duisburg-Essen, Germany
Tim Trew, Philips Research, The Netherlands

Abstract
This panel is about system testing of software product line artifacts. The panelist will present different approaches for software product line testing. Together, we will discuss their pros and cons. As a kind of benchmark, a common example of an online store (The eShop Product Line) will be used to ease the comparison of the different testing approaches.

Overview
Each panelist will present an approach to test the domain and application artifacts in software product line engineering. The decision whether to test the domain artifacts in domain engineering or if testing is delayed to application engineering is left to the panelists.

To facilitate a better comparison of the different test approaches, each panelist will illustrate his approach using a running example of an online store product line.

The discussions will, among others, cover the following questions:

  • Should there be system testing in domain engineering, or should system tests be performed during application engineering only?
  • Which test artifacts can be reused during product line testing?
  • Is there an advantage of creating domain test artifacts which are reused during application engineering?
  • Can application test cases be generated? And if so, should they be generated from domain test cases or just from application engineering artifacts?
  • Does the model-based test case derivation offer benefits when compared with deriving test cases directly from natural language requirements?

Panel 3 (P3)
Product Line Research: Lessons Learned from the last 10 years and Directions for the next 10
24 August 2006

Moderator: Liam O'Brien, Lero, The Irish Software Engineering Research Centre

Panelists:
Paul Clements, Software Engineering Institute, USA
Kyo Kang, POSTECH, Korea
Dirk Muthig, Fraunhofer IESE, Germany
Klaus Pohl, Lero, The Irish Software Engineering Research Centre & University of Duisburg-Essen, Germany

Abstract
This panel is about past and future research in software product lines. The panelists will look back at the past 10 years to examine outcomes and lessons learned and will look forward to the next 10 years and will give potential outcomes and directions for the future of software product line research. The outcomes will be examined for relevance to the practitioner community.

Overview
Each panelist will present their lessons learned from the past and the directions for the next 10 years. Several industry judges will be asked to make a determination as to how useful the outcomes have been or will be for practitioners. The panelists will have an opportunity to respond to the judges comments and this will lead to a general discussion.

The discussions will, among others, cover the following questions:

  • What have been the main lessons and outcomes for research in software product lines over the past 10 years?
  • What will likely be the major directions and outcomes for research in software product lines over the next 10 years?
  • How relevant have the past outcomes been for practitioners and how relevant will future outcomes be for practitioners?
  • What will be the next big breakthrough for software product line research?

  

Contact Information:
For general information, contact John D. McGregor.
For web site information, contact Bob Krut.