Panel 2 (P2)
10th
International Software Product Line Conference
(SPLC 2006)
21-24 August
2006
Baltimore, Maryland, USA
Panel on Testing in a Software Product Line
23 August
2006
Panel moderator: Klaus Pohl, Lero, The Irish Software Engineering Research Centre & University of Duisburg-Essen, Germany
Panelists:
Georg Grütter,
Robert Bosch GmbH, Germany
John D. McGregor, Clemson University, USA
Andreas Metzger, University of Duisburg-Essen, Germany
Tim Trew,
Philips Research, The Netherlands
Abstract
This panel is about
system testing of software product line artifacts. The panelist will present
different approaches for software product line testing. Together, we will
discuss their pros and cons. As a kind of benchmark, a common example of an
online store (The eShop Product Line) will be
used to ease the comparison of the different testing approaches.
Overview
Each panelist will
present an approach to test the domain and application artifacts in software
product line engineering. The decision whether to test the domain artifacts in
domain engineering or if testing is delayed to application engineering is left
to the panelists.
To facilitate a better comparison of the different test approaches, each panelist will illustrate his approach using a running example of an online store product line.
The discussions will, among others, cover the following questions:
- Should there be system testing in domain engineering, or should system tests be performed during application engineering only?
- Which test artifacts can be reused during product line testing?
- Is there an advantage of creating domain test artifacts which are reused during application engineering?
- Can application test cases be generated? And if so, should they be generated from domain test cases or just from application engineering artifacts?
- Does the model-based test case derivation offer benefits when compared with deriving test cases directly from natural language requirements?
