International Liability Issues for Software Quality
This report focuses on international law related to cybercrime, international information security standards, and software liability issues as they relate to information security for critical infrastructure applications. Each area is explored and implications for U.S. policy and efforts to create cybersecurity policy worldwide are discussed. Recommendations are made for U.S. government participation and leadership.
This report is one of a series of reports on U.S. policy by the CERT Coordination Center. Prior reports focused on international infrastructure for global security incident response and the technical challenges and global policy issues of tracking and tracing cyber attacks.
This report is related to the following area(s) of work:
Security and SurvivabilitySpecial Report
CMU/SEI-2003-SR-001
July 2003
Cite This Report
SEI:
Mead, Nancy; International Liability Issues for Software Quality (CMU/SEI-2003-SR-001). Software Engineering Institute, Carnegie Mellon University, 2003. http://www.sei.cmu.edu/library/abstracts/reports/03sr001.cfm
IEEE:
N. Mead, "International Liability Issues for Software Quality," Software Engineering Institute, Carnegie Mellon University, Pittsburgh, Pennsylvania, Special Report CMU/SEI-2003-SR-001, 2003. http://www.sei.cmu.edu/library/abstracts/reports/03sr001.cfm
APA:
Mead, N., (2003). International Liability Issues for Software Quality (CMU/SEI-2003-SR-001). Retrieved May 24, 2013, from the Software Engineering Institute, Carnegie Mellon University website: http://www.sei.cmu.edu/library/abstracts/reports/03sr001.cfm
CHI:
Mead, Nancy, International Liability Issues for Software Quality (CMU/SEI-2003-SR-001). Pittsburgh, PA: Software Engineering Institute, Carnegie Mellon University, 2003. http://www.sei.cmu.edu/library/abstracts/reports/03sr001.cfm
MLA:
Mead, N., 2003. International Liability Issues for Software Quality (Technical Report CMU/SEI-2003-SR-001). Pittsburgh: Software Engineering Institute, Carnegie Mellon University. http://www.sei.cmu.edu/library/abstracts/reports/03sr001.cfm
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